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2010年1月22日，南非獨(dú)立通信管理局(ICASA)發(fā)布了《電子通訊設(shè)備技術(shù)標(biāo)準(zhǔn)法規(guī)》。2013年4月16日，ICASA又發(fā)布了有關(guān)實(shí)施該法規(guī)的公告。法規(guī)及公告中都規(guī)定了技術(shù)設(shè)備和電子通訊設(shè)備的ICASA法規(guī)符合性標(biāo)準(zhǔn)清單，這些標(biāo)準(zhǔn)主要涉及設(shè)備的電磁兼容(EMC)標(biāo)準(zhǔn)、安全標(biāo)準(zhǔn)和性能標(biāo)準(zhǔn)。其中，EMC標(biāo)準(zhǔn)還包括基礎(chǔ)EMC標(biāo)準(zhǔn)，通用EMC標(biāo)準(zhǔn)和產(chǎn)品/產(chǎn)品族的EMC標(biāo)準(zhǔn)。表1、表2、表3列出了設(shè)備進(jìn)行ICASA認(rèn)證的基礎(chǔ)EMC標(biāo)準(zhǔn)、通用EMC標(biāo)準(zhǔn)和安全標(biāo)準(zhǔn)。
表1 技術(shù)設(shè)備和電子通訊設(shè)備ICASA認(rèn)證的基礎(chǔ)EMC標(biāo)準(zhǔn)
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設(shè)備所述類型
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適用標(biāo)準(zhǔn)
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Radio disturbance and immunity apparatus - Measuring apparatus
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SANS 216-1-1[CISPR 16-1-1 ed2.1](CISPR 16 -1 -1 ed3)
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Radio disturbance and immunity apparatus - Conducted disturbances
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SANS 216-1-2(CISPR 16-1-2 ed1.2)
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Radio disturbance and immunity apparatus - Disturbance power
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SANS 216-1-3(CISPR 16-1-3 ed2)
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Radio disturbance and immunity apparatus - Radiated disturbance
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SANS 216-1-4[CISPR 16-1-4 ed2](CISPR 16-1-4 ed3)
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Radio disturbance and immunity apparatus - Antenna calibration test sites for 30 MHz to 1000MHz
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SANS 216-1-5(CISPR 16-1-5 ed1)
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Method of measurement of disturbances and immunity - Conducted disturbance measurements
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SANS 216-2-1[CISPR 16-2-1 ed1.1](CISPR 16-2-1 ed2)
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Method of measurement of disturbances and immunity - Measurement of disturbance power
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SANS 216-2-2[CISPR 16-2-2 ed1.2](CISPR 16-2-2 ed2)
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Method of measurement of disturbances and immunity - Radiated disturbance measurements
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SANS 216-2-3[CISPR 16-2-3 ed2](CISPR 16-2-3 ed3)
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Method of measurement of disturbances and immunity - immunity measurements
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SANS 216-2-4(CISPR 16-2-4 ed1)
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Limits for harmonic current emissions (equipment input current <= 6A per phase)
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SANS 61000-3-2[IEC 61000-16-3-2 ed3](IEC 61000-3-2 ed3.2)
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Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection
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SANS 61000-3-3(IEC 61000-3-3 ed1.2)&SANS 61000-3-3(IEC 61000-3-3 Ed2)
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Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A
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SANS 61000-3-4(IEC 61000-3-4 ed1)
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Limits Limitations and flicker in low-voltage power supply systems for equipment with rated current greater than 16A
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SANS 61000-3-5[IEC 61000-3-5 ed1](IEC 61000-3-5 ed2)
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Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - equipment with rated current <= 75A and subject to conditional connection
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SANS 61000-3-11(IEC 61000-3-11 ed1)
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Electrostatic discharge immunity test
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SANS 61000-4-2[IEC 61000-4-2 ed1.2](IEC 61000-4-2 ed2)
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Radiated, radio-frequency, electromagnetic field immunity test
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SANS 61000-4-3[IEC 61000-4-3 ed3](IEC 61000-4-3 ed3. 1)
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Electrical fast transient/burst immunity test
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SANS 61000-4-4(IEC 61000-4-4 ed2)
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Surge immunity test
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SANS 61000-4-5(IEC 61000-4-5 ed2)
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Immunity to conducted disturbances, induced by radio-frequency fields
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SANS 61000-4-6[IEC 61000-4-6 ed2.2](IEC 61000-4-6 ed3)
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General guide on harmonics and interharmonics measurements and instrumentation, forpower supply systems and equipment connected
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SANS 61000-4-7[IEC 61000-4-7 ed2](IEC 61000-4-7 ed2.1)
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Power frequency magnetic field immunity test
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SANS 61000-4-8[IEC 61000-4-8 ed1.1](IEC 61000-4-8 ed2)
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Pulse magnetic field immunity test
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SANS 61000-4-9(IEC 61000-4-9 ed1 1)
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Damped oscillatory magnetic field immunity test
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SANS 61000-4-10(IEC 61000-4-10 ed1.1)
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Voltage dips, short interruptions and voltage variations immunity tests
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SANS 61000-4-11(IEC 61000-4-11 ed1)
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Oscillatory waves immunity test
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SANS 61000-4-12(IEC 61000-4-12 ed2)
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Harmonics and interharmonics including mains signalling at a.c. power port, low frequencyimmunity tests
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SANS 61000-4-13[IEC 61000-16-4-13 ed1](IEC 61000-4-13 ed1.1)
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Voltage fluctuation immunity test
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SANS 61000-4-14[IEC 61000-16-4-14 ed1.1](IEC 61000-4-14 ed1.2)
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Test for disturbances in the frequency range 0 Hz to 150 kHz
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SANS 61000-4-16(IEC 61000-4-16 ed1.1)
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Ripple on d.c. input power port immunity test
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SANS 61000-4-17[IEC 61000-4-17 ed1.1](IEC 61000-4-17 ed1.2)
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Emission and immunity testing in transverse electromagnetic (TEM) waveguides
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SANS 61000-4-20[IEC 61000-4-20 ed1.1](IEC 61000-4-20 ed2)
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Unbalance, immunity test
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SANS 61000-4-27[IEC 61000-4-17 edl](IEC 61000-4-27 ed1.1)
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Variation of power frequency, immunity test
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SANS 61000-4-28[IEC 61000-4-28 ed1.1](IEC 61000-4-28 ed1.2)
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Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
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SANS 61000-4-29(IEC 61000-4-29 ed1)
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Power quality measurement methods
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SANS 61000-4-30[IEC 61000-4-30 ed1](IEC 61000-4-30 ed2)
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Power supply interface at the input to telecommunication equipment Part 1: Operated byalternating (ac) derived from direct current (dc) sources
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SANS 300132-1(ETS300132-1 V1)
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Power supply interface at the input to telecommunication equipment Part 2: Operated by directcurrent (dc)
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SANS 300132-2(ETS300132-2 V2.1.2)
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Power supply interface at the input to telecommunication equipment Part 3: Operated byrectified current source, alternating current source or direct current source up to 400 V
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SANS 300132-3(ETS300132-3 V1.2.1)
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表2技術(shù)設(shè)備和電子通訊設(shè)備ICASA認(rèn)證的通用EMC標(biāo)準(zhǔn)
|
設(shè)備所述類型
|
適用標(biāo)準(zhǔn)
|
|
Radio disturbance and immunity apparatus - Measuring apparatus
|
SANS 216-1-1[CISPR 16-1-1 ed2.1](CISPR 16 -1 -1 ed3)
|
|
Radio disturbance and immunity apparatus - Conducted disturbances
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SANS 216-1-2(CISPR 16-1-2 ed1.2)
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Radio disturbance and immunity apparatus - Disturbance power
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SANS 216-1-3(CISPR 16-1-3 ed2)
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Radio disturbance and immunity apparatus - Radiated disturbance
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SANS 216-1-4[CISPR 16-1-4 ed2](CISPR 16-1-4 ed3)
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|
Radio disturbance and immunity apparatus - Antenna calibration test sites for 30 MHz to 1000MHz
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SANS 216-1-5(CISPR 16-1-5 ed1)
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|
Method of measurement of disturbances and immunity - Conducted disturbance measurements
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SANS 216-2-1[CISPR 16-2-1 ed1.1](CISPR 16-2-1 ed2)
|
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Method of measurement of disturbances and immunity - Measurement of disturbance power
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SANS 216-2-2[CISPR 16-2-2 ed1.2](CISPR 16-2-2 ed2)
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Method of measurement of disturbances and immunity - Radiated disturbance measurements
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SANS 216-2-3[CISPR 16-2-3 ed2](CISPR 16-2-3 ed3)
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Method of measurement of disturbances and immunity - immunity measurements
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SANS 216-2-4(CISPR 16-2-4 ed1)
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Limits for harmonic current emissions (equipment input current <= 6A per phase)
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SANS 61000-3-2[IEC 61000-16-3-2 ed3](IEC 61000-3-2 ed3.2)
|
|
Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection
|
SANS 61000-3-3(IEC 61000-3-3 ed1.2)&SANS 61000-3-3(IEC 61000-3-3 Ed2)
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|
Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A
|
SANS 61000-3-4(IEC 61000-3-4 ed1)
|
|
Limits Limitations and flicker in low-voltage power supply systems for equipment with rated current greater than 16A
|
SANS 61000-3-5[IEC 61000-3-5 ed1](IEC 61000-3-5 ed2)
|
|
Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - equipment with rated current <= 75A and subject to conditional connection
|
SANS 61000-3-11(IEC 61000-3-11 ed1)
|
|
Electrostatic discharge immunity test
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SANS 61000-4-2[IEC 61000-4-2 ed1.2](IEC 61000-4-2 ed2)
|
|
Radiated, radio-frequency, electromagnetic field immunity test
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SANS 61000-4-3[IEC 61000-4-3 ed3](IEC 61000-4-3 ed3. 1)
|
|
Electrical fast transient/burst immunity test
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SANS 61000-4-4(IEC 61000-4-4 ed2)
|
|
Surge immunity test
|
SANS 61000-4-5(IEC 61000-4-5 ed2)
|
|
Immunity to conducted disturbances, induced by radio-frequency fields
|
SANS 61000-4-6[IEC 61000-4-6 ed2.2](IEC 61000-4-6 ed3)
|
|
General guide on harmonics and interharmonics measurements and instrumentation, forpower supply systems and equipment connected
|
SANS 61000-4-7[IEC 61000-4-7 ed2](IEC 61000-4-7 ed2.1)
|
|
Power frequency magnetic field immunity test
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SANS 61000-4-8[IEC 61000-4-8 ed1.1](IEC 61000-4-8 ed2)
|
|
Pulse magnetic field immunity test
|
SANS 61000-4-9(IEC 61000-4-9 ed1 1)
|
|
Damped oscillatory magnetic field immunity test
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SANS 61000-4-10(IEC 61000-4-10 ed1.1)
|
|
Voltage dips, short interruptions and voltage variations immunity tests
|
SANS 61000-4-11(IEC 61000-4-11 ed1)
|
|
Oscillatory waves immunity test
|
SANS 61000-4-12(IEC 61000-4-12 ed2)
|
|
Harmonics and interharmonics including mains signalling at a.c. power port, low frequencyimmunity tests
|
SANS 61000-4-13[IEC 61000-16-4-13 ed1](IEC 61000-4-13 ed1.1)
|
|
Voltage fluctuation immunity test
|
SANS 61000-4-14[IEC 61000-16-4-14 ed1.1](IEC 61000-4-14 ed1.2)
|
|
Test for disturbances in the frequency range 0 Hz to 150 kHz
|
SANS 61000-4-16(IEC 61000-4-16 ed1.1)
|
|
Ripple on d.c. input power port immunity test
|
SANS 61000-4-17[IEC 61000-4-17 ed1.1](IEC 61000-4-17 ed1.2)
|
|
Emission and immunity testing in transverse electromagnetic (TEM) waveguides
|
SANS 61000-4-20[IEC 61000-4-20 ed1.1](IEC 61000-4-20 ed2)
|
|
Unbalance, immunity test
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SANS 61000-4-27[IEC 61000-4-17 edl](IEC 61000-4-27 ed1.1)
|
|
Variation of power frequency, immunity test
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SANS 61000-4-28[IEC 61000-4-28 ed1.1](IEC 61000-4-28 ed1.2)
|
|
Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
|
SANS 61000-4-29(IEC 61000-4-29 ed1)
|
|
Power quality measurement methods
|
SANS 61000-4-30[IEC 61000-4-30 ed1](IEC 61000-4-30 ed2)
|
|
Power supply interface at the input to telecommunication equipment Part 1: Operated byalternating (ac) derived from direct current (dc) sources
|
SANS 300132-1(ETS300132-1 V1)
|
|
Power supply interface at the input to telecommunication equipment Part 2: Operated by directcurrent (dc)
|
SANS 300132-2(ETS300132-2 V2.1.2)
|
|
Power supply interface at the input to telecommunication equipment Part 3: Operated byrectified current source, alternating current source or direct current source up to 400 V
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SANS 300132-3(ETS300132-3 V1.2.1)
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表3 技術(shù)設(shè)備和電子通訊設(shè)備ICASA認(rèn)證的安全標(biāo)準(zhǔn)
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設(shè)備類別
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適用標(biāo)準(zhǔn)
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被替代的標(biāo)準(zhǔn)
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信息技術(shù)設(shè)備的安全
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SANS 60950（IEC60950 ed2）
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SANS 60950（IEC60950 ed1）
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音頻、視頻及類似電子設(shè)備
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SANS 60065（IEC 60065）
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無
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測(cè)試、測(cè)量、控制及實(shí)驗(yàn)室用的電子設(shè)備
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SANS 61010-1（IEC 61010-1）
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無
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劉巧 2009年進(jìn)入億博檢測(cè)技術(shù)有限公司，擔(dān)任高級(jí)技術(shù)顧問。
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